SPIM: Selective plane illumination microscopy

Written by webmaster on 22 June 2021. Posted in Laboratory.

SPIM is a kind of microscopy of single plane illumination, characterized by its ultrafine light beam that illuminates the sample perpendicularly to the observation objective, allowing generation of images of different sections of the sample, which get integrated to generate a 3D image. This emerging technique, besides being cheaper than confocal microscopy, allows a fast acquisition of images and minimizes sample damaging because of photo-oxidation. This is one of the few microscopes manufactured in MIP type lab in Latin America and with international technical support.